Macroscopic and Microscopic surface features of Hydrogenated silicon thin films

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dc.contributor.advisorMuller, Theo
dc.contributor.authorPepenene, Refuoe Donald
dc.date.accessioned2018-09-18T11:36:34Z
dc.date.accessioned2024-10-30T10:23:39Z
dc.date.available2018-12-31T22:10:06Z
dc.date.available2024-10-30T10:23:39Z
dc.date.issued2018
dc.descriptionMagister Scientiae - MSc (Physics)
dc.description.abstractAn increasing energy demand and growing environmental concerns regarding the use of fossil fuels in South Africa has led to the challenge to explore cheap, alternative sources of energy. The generation of electricity from Photovoltaic (PV) devices such as solar cells is currently seen as a viable alternative source of clean energy. As such, crystalline, amorphous and nanocrystalline silicon thin films are expected to play increasingly important roles as economically viable materials for PV development. Despite the growing interest shown in these materials, challenges such as the partial understanding of standardized measurement protocols, and the relationship between the structure and optoelectronic properties still need to be overcome.
dc.identifier.urihttps://hdl.handle.net/10566/16663
dc.language.isoen
dc.publisherUniversity of the Western Cape
dc.rights.holderUniversity of the Western Cape
dc.subjectHot-wire chemical vapour deposition (HWCVD), Hydrogenated amorphous silicon (a-Si: H), Hydrogenated nanocrystalline silicon (nc-Si: H), Hydrogen dilution, Nano-structural properties, Root mean square (rms) roughness, Dielectric functions, Band gap, Refractive index, Bruggeman Effective Medium Approximations (BEMA), Traceability, Optical modelling
dc.titleMacroscopic and Microscopic surface features of Hydrogenated silicon thin films

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