Electronic conduction in hot-pressed calcium manganese oxide ceramics

dc.contributor.authorMahapatro, Ajit
dc.contributor.authorPant, Megha
dc.date.accessioned2026-04-02T06:17:40Z
dc.date.available2026-04-02T06:17:40Z
dc.date.issued2025
dc.description.abstractThe basic concepts of electronic charge transport in materials are crucial for understanding and improving device performances. The electronic conduction is investigated through perfectly dense calcium manganese oxide (CaMnO3) ceramics prepared with simultaneous application of pressure (64 MPa) and temperature (1073 K) using hot-press technique. A proposed model, comprising of grain boundary assisted hopping and trap assisted transport mechanisms agrees well with the acquired current – voltage characteristics in the temperature range of 133–373 K. The estimated decrease in trap charge density with increasing temperature from 1015 cm 3 at 133 K to 109 cm􀀀 3 at 373 K is attributed to the temperature assisted detrapping of the highly localized trap charge carriers, resulting in lesser availability of trapped charges with increasing temperature. An energy band diagram is demonstrated by implementing the broadening and shifting of energetic trap distribution towards deep into the energy gap with increasing temperature observed in the capacitance-frequency measurements and leads to merging of trap states with the conduction band
dc.identifier.citationPant, M. & Mahapatro, A. K. (2025) Electronic conduction in hot-pressed calcium manganese oxide ceramics. Ceramics international. [Online] 51 (24), 42389–42396.
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2025.06.452
dc.identifier.urihttps://hdl.handle.net/10566/22162
dc.language.isoen
dc.publisherElsevier Ltd
dc.subjectCalcium manganese oxide ceramics
dc.subjectHot-press technique
dc.subjectElectronic conduction
dc.subjectVariable range hopping
dc.subjectTrap limited current
dc.titleElectronic conduction in hot-pressed calcium manganese oxide ceramics
dc.typeArticle

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