Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon
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Date
2021
Authors
Journal Title
Journal ISSN
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Publisher
IOP Publishing
Abstract
Silicon photomultipliers are regarded as a very promising technology for nextgeneration,
cutting-edge detectors for low-background experiments in particle physics. This work
presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in
liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of
Münster has been used that allows to acquire angle-resolved reflection measurements of various
samples immersed in liquid xenon with 0 45 angular resolution. Four samples are investigated in
this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and
one Large-Area Avalanche Photodiode (LA-APD) from EXO-200.
Description
Keywords
Photon detectors for UV, IR photons, APDs, PIN diodes, Solid state
Citation
Wagenpfeil, M. & Ziegler, T. & Schneider, J. & Fieguth, A. & Murra, M. & Schulte, Denny & Althueser, L. & Huhmann, C. & Weinheimer, C. & Michel, Tayoumkam & Anton, G. & Adhikari, G. & Kharusi, S. & Angelico, E. & Arnquist, I. & Badhrees, I. & Bane, J. & Beck, D. & Belov, Vladimir. (2021). Reflectivity of VUV-sensitive Silicon Photomultipliers in Liquid Xenon.