Statistics for Synthesis and characterization of ion implanted Pd/Ti/V/Pd/Ti based multilayer thin films using rutherford backscattering spectrometry (rbs) and elastic recoil detection analysis (erda) for hydrogen storage application

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Synthesis and characterization of ion implanted Pd/Ti/V/Pd/Ti based multilayer thin films using rutherford backscattering spectrometry (rbs) and elastic recoil detection analysis (erda) for hydrogen storage application 1

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